The new state-of-the-art atomic resolution scanning transmission electron microscope (AR-STEM) has arrived to the National Institute of Chemistry on May, 30th 2013.

The AR-STEM project is conjointly run by Center of Excellence for Low Carbon Technologies (CONOT) and the National Institute of Chemistry (NIC).

The JEM  ARM 200 CF is transmission electron microscope fitted with a cold field-emission gun and probe spherical aberration corrector (CESCOR unit from the CEOS Company).

It enables atom-by-atom imaging resolution and unmatched spatial resolution for atom-to-atom chemical mapping of materials, including EDS (energy-dispersive x-ray spectroscopy) and EELS (electron energy-loss spectroscopy). 

The range of studied materials will be very wide, from material science where nanopartciles, crystal defects, interfaces and surface phenomena will be studied to life science with cryo electron microscopy, single particle analysis and EM reconstruction.